Nicola Viganò

He works as a researcher at ESRF - The European Synchrotron, Grenoble, France.

International peer reviewed journals

2022

  • [J14] E. Longo, D. Alj, K. J. Batenburg, O. de La Rochefoucauld, C. Herzog, I. Greving, Y. Li, M. Lyubomirskiy, K. V. Falch, P. Estrela, S. Flenner, N. Viganò, M. Fajardo, and P. Zeitoun, “Flexible Plenoptic X-ray Microscopy,” Photonics, vol. 9, no. 2, p. 98, Feb. 2022. https://doi.org/10.3390/photonics9020098

2021

  • [J13] A. A. Hendriksen, D. Schut, W. J. Palenstijn, N. Viganò, J. Kim, D. M. Pelt, T. van Leeuwen, and K. J. Batenburg, “Tomosipo: Fast, flexible, and convenient 3D tomography for complex scanning geometries in Python,” Opt. Express, vol. 29, no. 24, p. 40494, Nov. 2021. https://doi.org/10.1364/OE.439909
  • [J12] A. A. Hendriksen, M. Bührer, L. Leone, M. Merlini, N. Viganò, D. M. Pelt, F. Marone, M. di Michiel, and K. J. Batenburg, “Deep denoising for multi-dimensional synchrotron X-ray tomography without high-quality reference data,” Sci. Rep., vol. 11, no. 1, p. 11895, Jun. 2021. https://doi.org/10.1038/s41598-021-91084-8

2020

  • [J11] N. Viganò, F. Lucka, O. de La Rochefoucauld, S. B. Coban, R. van Liere, M. Fajardo, P. Zeitoun and K.J. Batenburg, “Emulation of X-ray Light-Field Cameras,” J. Imaging, vol. 6, no. 12, p. 15, Dec. 2020. https://doi.org/10.3390/jimaging6120138
    Note: Cover story of the December 2020 issue: https://www.mdpi.com/2313-433X/6/12
  • [J10] N. Viganò and W. Ludwig, “X-ray orientation microscopy using topo-tomography and multi-mode diffraction contrast tomography,” Curr. Opin. Solid State Mater. Sci., vol. 24, no. 4, p. 100832, Aug. 2020. https://doi.org/10.1016/j.cossms.2020.100832
  • [J9] C. Gramaccioni, Y. Yang, A. Pacureanu, N. Viganò, A. Procopio, P. Valenti, L. Rosa, F. Berlutti, S. Bohic, and P. Cloetens, “Cryo-nanoimaging of Single Human Macrophage Cells: 3D Structural and Chemical Quantification,” Anal. Chem., vol. 92, n. 7, p. 4814-4819, Mar. 2020. https://doi.org/10.1021/acs.analchem.9b04096

2019

  • [J8] N. Viganò, P. M. Gil, C. Herzog, O. de la Rochefoucauld, R. van Liere, and K. J. Batenburg, “Advanced light-field refocusing through tomographic modeling of the photographed scene,” Opt. Express, vol. 27, no. 6, p. 7834, Mar. 2019. https://doi.org/10.1364/OE.26.022574

2018

  • [J7] Z. Zhong, W. J. Palenstijn, N. Viganò, and K. J. Batenburg, “Numerical methods for low-dose EDS tomography,” Ultramicroscopy, vol. 194, no. June, pp. 133–142, Nov. 2018. https://doi.org/10.1107/S1600576716002302
  • [J6] N. Viganò, H. Der Sarkissian, C. Herzog, O. de la Rochefoucauld, R. van Liere, and K. J. Batenburg, “Tomographic approach for the quantitative scene reconstruction from light field images,” Opt. Express, vol. 26, no. 18, p. 22574, Sep. 2018. https://doi.org/10.1364/OE.27.007834

2017

  • [J5] N. Viganò, and V. A. Solé, “Physically corrected forward operators for induced emission tomography: a simulation study,” Meas. Sci. Technol., no. Advanced X-Ray Tomography, pp. 1–26, Nov. 2017. https://doi.org/10.1088/1361-6501/aa9d54

2016

  • [J4] N. Viganò, L. Nervo, L. Valzania, G. Singh, M. Preuss, K. J. Batenburg, and W. Ludwig, “A feasibility study of full-field X-ray orientation microscopy at the onset of deformation twinning,” J. Appl. Crystallogr., vol. 49, no. 2, Apr. 2016. https://doi.org/10.1107/S1600576716002302
  • [J3] N. Viganò, A. Tanguy, S. Hallais, A. Dimanov, M. Bornert, K. J. Batenburg, and W. Ludwig, “Three-dimensional full-field X-ray orientation microscopy,” Sci. Rep., vol. 6, Feb. 2016. http://doi.org/10.1038/srep20618

2014

  • [J2] N. Viganò, W. Ludwig, and K. J. Batenburg, “Reconstruction of local orientation in grains using a discrete representation of orientation space,” J. Appl. Crystallogr., vol. 47, no. 6, pp. 1826–1840, Oct. 2014. https://doi.org/10.1107/S1600576714020147

2013

  • [J1] P. Reischig, A. King, L. Nervo, N. Viganò, Y. Guilhem, W. J. Palenstijn, K. J. Batenburg, M. Preuss, and W. Ludwig, “Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials,” J. Appl. Crystallogr., vol. 46, no. 2, pp. 297–311, Mar. 2013. https://doi.org/10.1107/S0021889813002604
    Note: Cover story of the special issue on X-ray diffraction microscopy of March 2013: http://journals.iucr.org/special_issues/2013/imaging/

Conference Proceedings

2022

  • [C9] P. Resende, N. Viganò, D. Bardel, J. Réthoré, and W. Ludwig, “Advanced time-resolved characterization of Stress Assisted Grain Boundary Oxidation of 718 Ni superalloy,” IOP Conference Series: Materials Science and Engineering, vol. 1249, no. 1, pp. 012046, Jul. 2022. http://doi.org/10.1088/1757-899X/1249/1/012046
  • [C8] Z. Liu, N. Viganò, and W. Ludwig, “Challenges related to tomographic reconstruction of 3D intragranular orientation fields in the presence of orientation relationships,” IOP Conference Series: Materials Science and Engineering, vol. 1249, no. 1, pp. 012030, Jul. 2022. http://doi.org/10.1088/1757-899X/1249/1/012030

2021

  • [C7] P. Harrison, X. Zhou, M. Das Saurabh, N. Viganò, P. Lhuissier, M. Herbig, W. Ludwig, and E. Rauch, “Reconstructing grains in 3D through 4D Scanning Precession Electron Diffraction,” Microsc. Microanal., vol. 27, no. S1, pp. 2494–2495, Aug. 2021. http://doi.org/10.1017/S1431927621008898
  • [C6] N. Viganò, P. Cloetens, M. Di Michiel, A. Rack, and P. Tafforeau, “Redefining the ESRF tomography software,” in OSA Imaging and Applied Optics Congress, 2021. http://doi.org/10.1364/DH.2021.DF2G.4
  • [C5] N. Viganò, F. Lucka, O. de La Rochefoucauld, S. B. Coban, R. van Liere, M. Fajardo, P. Zeitoun, and K. J. Batenburg, “Towards X-ray Plenoptic Imaging: Emulation with a Laboratory X-ray Scanner,” in OSA Imaging and Applied Optics Congress, 2021. http://doi.org/10.1364/DH.2021.DTh4F.2

2018

2016

  • [C2] N. Viganò, K. J. Batenburg, and W. Ludwig, “An orientation-space super sampling technique for six-dimensional diffraction contrast tomography,” Fundam. Informaticae, no. 146, pp. 219–230, 2016. https://doi.org/10.3233/FI-2016-1383

2013

  • [C1] N. Viganò, W. Ludwig, and K. J. Batenburg, “Discrete representation of local orientation in grains using diffraction contrast tomography,” in 2013 8th International Symposium on Image and Signal Processing and Analysis (ISPA), 2013, no. 1, pp. 594–599. https://doi.org/10.1109/ISPA.2013.6703809
    Note: Winner of "Best Paper Award" at ISISPA2013

Datasets

2020